APT数据处理 APT Data Processing
-
1/人使用者
-
20/次机时次数
-
75/小时总时长
-
0/次送样次数
-
1/人收藏者
-
收费标准
机时0元/小时 -
设备型号
IVAS -
当前状态
-
管理员
邱嘉雯 Carmen Jiawen QIU 020-88338487 -
放置地点
W1-122
- 仪器信息
- 预约资源
- 附件下载
- 公告
- 同类仪器
名称
APT数据处理 APT Data Processing
资产编号
MC-SA-0007 data
型号
IVAS
规格
产地
美国
厂家
CAMECA
所属品牌
CAMECA
出产日期
购买日期
所属单位
材料表征与制备中央实验室 Materials Characterization and Preparation Facility (GZ)
使用性质
科研
所属分类
MCPF-表面分析 Surface Analysis
资产负责人
邱嘉雯 Carmen Jiawen QIU
联系电话
020-88338487
联系邮箱
carmenjwqiu@hkust-gz.edu.cn
放置地点
W1-122
- 主要规格&技术指标
- 主要功能及特色
主要规格&技术指标
Specifically developed for the CAMECA APT instruments, the IVAS® software runs on the latest Windows® operating systems and offers powerful multi-threaded 64-bit computational analysis.
主要功能及特色
IVAS key features include but are not limited to:
1.Ability to reconstruct wide Field Of View atom probe data using 3D reconstruction wizard
2.Intuitive ‘Tree view’ to manipulate and manage atom probe projects
3.Integrated electronic user manual
4.Ability to export 1-D, 2-D,a nd 3-D quantitative results in native formats to popular statistical/analysis software
5.Solute analysis including envelope, precipitate, 3D Johnson and Klotz ordering, contingency table, markov chain, tracer, and LBM method
6.3D Orthographic views
7.Axis scale control with user selected foreground and background color
8.Projection, clipping, and XYZ image plane rotation from multiple points of view
9.Optional density relaxation during reconstruction
10.Reconstruction explorer
11.Gaussian smoothing of discrete data
12.Thermal color shading and contour plots
13.Range file management
14.High resolution image capture
15.Movie export
16.Isosurface definition and sorting
17.Ability to plot and analyze mass spectra
18.Complex Region Of Interest manipulation and analysis
19.Radial distribution function
20.Proximity histograms
21.Spatial distribution maps
22.Advanced spectral analysis
23.Advanced image exporting
24.Predictive Periodic table overlay in mass spectrum during analysis
25.Ability to identify interfaces and calculate various surface roughness statistics in compliance with international standards (ASME B46)
26.Bulk composition panel displays statistics using atomic weighting/ionic weighting and decomposed ionic weighting
27.Choice of Lin/Log scales for all composition and histogram displays
28.Save/Restore/Apply Analysis state.
1.Ability to reconstruct wide Field Of View atom probe data using 3D reconstruction wizard
2.Intuitive ‘Tree view’ to manipulate and manage atom probe projects
3.Integrated electronic user manual
4.Ability to export 1-D, 2-D,a nd 3-D quantitative results in native formats to popular statistical/analysis software
5.Solute analysis including envelope, precipitate, 3D Johnson and Klotz ordering, contingency table, markov chain, tracer, and LBM method
6.3D Orthographic views
7.Axis scale control with user selected foreground and background color
8.Projection, clipping, and XYZ image plane rotation from multiple points of view
9.Optional density relaxation during reconstruction
10.Reconstruction explorer
11.Gaussian smoothing of discrete data
12.Thermal color shading and contour plots
13.Range file management
14.High resolution image capture
15.Movie export
16.Isosurface definition and sorting
17.Ability to plot and analyze mass spectra
18.Complex Region Of Interest manipulation and analysis
19.Radial distribution function
20.Proximity histograms
21.Spatial distribution maps
22.Advanced spectral analysis
23.Advanced image exporting
24.Predictive Periodic table overlay in mass spectrum during analysis
25.Ability to identify interfaces and calculate various surface roughness statistics in compliance with international standards (ASME B46)
26.Bulk composition panel displays statistics using atomic weighting/ionic weighting and decomposed ionic weighting
27.Choice of Lin/Log scales for all composition and histogram displays
28.Save/Restore/Apply Analysis state.
预约资源
附件下载
公告
同类仪器