APT数据处理 APT Data Processing

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    使用者
  • 20/次
    机时次数
  • 75/小时
    总时长
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    收藏者

收费标准

机时
0元/小时

设备型号

IVAS

当前状态

管理员

邱嘉雯 Carmen Jiawen QIU 020-88338487

放置地点

W1-122
  • 仪器信息
  • 预约资源
  • 附件下载
  • 公告
  • 同类仪器

名称

APT数据处理 APT Data Processing

资产编号

MC-SA-0007 data

型号

IVAS

规格

产地

美国

厂家

CAMECA

所属品牌

CAMECA

出产日期

购买日期

所属单位

材料表征与制备中央实验室 Materials Characterization and Preparation Facility (GZ)

使用性质

科研

所属分类

MCPF-表面分析 Surface Analysis

资产负责人

邱嘉雯 Carmen Jiawen QIU

联系电话

020-88338487

联系邮箱

carmenjwqiu@hkust-gz.edu.cn

放置地点

W1-122
  • 主要规格&技术指标
  • 主要功能及特色
主要规格&技术指标
Specifically developed for the CAMECA APT instruments, the IVAS® software runs on the latest Windows® operating systems and offers powerful multi-threaded 64-bit computational analysis.
主要功能及特色
IVAS key features include but are not limited to:
1.Ability to reconstruct wide Field Of View atom probe data using 3D reconstruction wizard
2.Intuitive ‘Tree view’ to manipulate and manage atom probe projects
3.Integrated electronic user manual
4.Ability to export 1-D, 2-D,a nd 3-D quantitative results in native formats to popular statistical/analysis software
5.Solute analysis including envelope, precipitate, 3D Johnson and Klotz ordering, contingency table, markov chain, tracer, and LBM method
6.3D Orthographic views
7.Axis scale control with user selected foreground and background color
8.Projection, clipping, and XYZ image plane rotation from multiple points of view
9.Optional density relaxation during reconstruction
10.Reconstruction explorer
11.Gaussian smoothing of discrete data
12.Thermal color shading and contour plots
13.Range file management
14.High resolution image capture
15.Movie export
16.Isosurface definition and sorting
17.Ability to plot and analyze mass spectra
18.Complex Region Of Interest manipulation and analysis
19.Radial distribution function
20.Proximity histograms
21.Spatial distribution maps
22.Advanced spectral analysis
23.Advanced image exporting
24.Predictive Periodic table overlay in mass spectrum during analysis
25.Ability to identify interfaces and calculate various surface roughness statistics in compliance with international standards (ASME B46)
26.Bulk composition panel displays statistics using atomic weighting/ionic weighting and decomposed ionic weighting
27.Choice of Lin/Log scales for all composition and histogram displays
28.Save/Restore/Apply Analysis state.
预约资源
附件下载
公告
同类仪器