高分辨率透射电子显微镜 High-resolution Transmission Electron Microscope
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设备型号
Talos F200X -
当前状态
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管理员
应哲涵 Zhehan YING,樊圣垚 Shengyao Fan -
放置地点
W1-127
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名称
高分辨率透射电子显微镜 High-resolution Transmission Electron Microscope
资产编号
MC-NA-0001
型号
Talos F200X
规格
产地
捷克
厂家
Thermo Fisher Scientific
所属品牌
Thermo Fisher Scientific
出产日期
购买日期
所属单位
材料表征与制备中央实验室 Materials Characterization and Preparation Facility (GZ)
使用性质
科研
所属分类
MCPF-纳米分析 Nano Analysis
资产负责人
应哲涵 Zhehan YING
联系电话
联系邮箱
yingzhehan@hkust-gz.edu.cn
放置地点
W1-127
- 主要规格&技术指标
- 主要功能及特色
- 样本检测注意事项
- 设备使用相关说明
主要规格&技术指标
Specifications主要规格&技术指标：
1. 电子枪: 高亮度肖特基场发射电子枪;
2. TEM模式信息分辨率: 0.12 nm;
3. TEM模式点分辨率: 0.25 nm;
4. STEM 模式分辨: 0.16 nm;
5. 加速电压: 80 kV, 200 kV;
6. 总束电流: >50 nA;
7. 分析束流:>=1.5 nA@1nm (200 kV);
8. 扫描透射(STEM)模式: 高角环形暗场探头(HAADF)、明场探头(BF)、环形暗场探头(ADF);
9. 电子能量损失谱EELS:探测器尺寸: 18μm^2 (2048 × 64 pixels);
10. 能量色散X射线谱EDX能量分辨率: Mn-Kα和10 kcps时<=136 eV (输出）
1. Electron Source: high-brightness Schottky X-FEG electron source;
2. TEM mode information limit: 0.12 nm;
3. TEM mode point resolution: 0.25 nm;
4. STEM HAADF mode resolution: 0.16 nm;
5. Accelerating Voltage: 80 kV, 200 kV;
6. Total beam current: >50 nA;
7. Probe current:>=1.5 nA@1nm(at 200kV);
8. Scanning transmission (STEM) mode: high-angle annular dark field (HAADF), bright field (BF), annular dark field (ADF);
9. EELS detector size: 18μm^2 (2048 × 64 pixels);
10. EDX energy resolution: <=136 eV (Mn-Kα) and 10 kcps (output)
1. 电子枪: 高亮度肖特基场发射电子枪;
2. TEM模式信息分辨率: 0.12 nm;
3. TEM模式点分辨率: 0.25 nm;
4. STEM 模式分辨: 0.16 nm;
5. 加速电压: 80 kV, 200 kV;
6. 总束电流: >50 nA;
7. 分析束流:>=1.5 nA@1nm (200 kV);
8. 扫描透射(STEM)模式: 高角环形暗场探头(HAADF)、明场探头(BF)、环形暗场探头(ADF);
9. 电子能量损失谱EELS:探测器尺寸: 18μm^2 (2048 × 64 pixels);
10. 能量色散X射线谱EDX能量分辨率: Mn-Kα和10 kcps时<=136 eV (输出）
1. Electron Source: high-brightness Schottky X-FEG electron source;
2. TEM mode information limit: 0.12 nm;
3. TEM mode point resolution: 0.25 nm;
4. STEM HAADF mode resolution: 0.16 nm;
5. Accelerating Voltage: 80 kV, 200 kV;
6. Total beam current: >50 nA;
7. Probe current:>=1.5 nA@1nm(at 200kV);
8. Scanning transmission (STEM) mode: high-angle annular dark field (HAADF), bright field (BF), annular dark field (ADF);
9. EELS detector size: 18μm^2 (2048 × 64 pixels);
10. EDX energy resolution: <=136 eV (Mn-Kα) and 10 kcps (output)
主要功能及特色
The Talos F200X transmission electron microscope provides the fastest, most accurate and quantitative multi-dimensional nanomaterial characterization and analysis capabilities. It can realize TEM and STEM imaging, selected area electron diffraction (SAED), energy-dispersive X-ray spectroscopy (EDX), tomography, in-situ heating, etc
样本检测注意事项
(1) Magnetic (e.g. Fe, Co, Ni， Mn)/Biological/Contaminated/Organic samples will NOT BE ALLOWED; 2) For authorized users only; 3) Cancellation or Booking at least 2 days in advance----- Violation of the rules will be disqualified.
Before booking, all users should contact the technician to confirm your time slots and clarify sample requirements.
Before booking, all users should contact the technician to confirm your time slots and clarify sample requirements.
设备使用相关说明
(1) Magnetic (e.g. Fe, Co, Ni， Mn)/Biological/Contaminated/Organic samples will NOT BE ALLOWED; 2) For authorized users only; 3) Cancellation or Booking at least 2 days in advance----- Violation of the rules will be disqualified.
Before booking, all users should contact the technician to confirm your time slots and clarify sample requirements.
Before booking, all users should contact the technician to confirm your time slots and clarify sample requirements.
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