多功能原子力显微镜
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6/人使用者
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29/次机时次数
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90/小时总时长
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51/次送样次数
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32/人收藏者
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收费标准
机时登录后显示送样详见检测项目 -
设备型号
AFM100 Plus -
当前状态
-
管理员
侯思润 Dennis Sirun HOU,樊圣垚 Shengyao Fan 020-88338509 13570351473 -
放置地点
W1-124
- 仪器信息
- 预约资源
- 检测项目
- 附件下载
- 公告
- 同类仪器
名称
多功能原子力显微镜
资产编号
MC-SA-0004
型号
AFM100 Plus
规格
AFM100 Plus
产地
厂家
Hitachi
所属品牌
Hitachi
出产日期
购买日期
所属单位
材料表征与制备中央实验室 Materials Characterization and Preparation Facility (GZ)
使用性质
科研
所属分类
MCPF-表面分析 Surface Analysis
资产负责人
侯思润 Dennis Sirun HOU
联系电话
020-88338509,13570351473
联系邮箱
sirunhou@hkust-gz.edu.cn
放置地点
W1-124
- 主要规格&技术指标
- 主要功能及特色
主要规格&技术指标
1.扫描范围：标准型20微米扫描器(XY:20um，Z:1.5um)，大范围100微米扫描器(XY:100um，Z:15um)
2.噪音水平：标准型扫描器小于0.03nm (RMS)
3.XY最大范围±2.5mm，Z轴歩进马达(步进 50nm)，范围 10mm，漂移量小于0.03nm/sec
4.样品台：直径20mm的金属样品台，带样品台扩大模块，样品最大尺寸为：直径35mmx10mm (H)
5.扫描器控制电压：XY (±200V/18bit) Z (±200V/26bit)，扫描线预览功能，最大四通道预览，扫描旋转 ±180°(0.1° step)
6.数据采集：4通道(最大2048 x 2048)，2通道(最大4096 x 4096)
1.Scan range: Standard 20μm scanner (XY: 20um, Z: 1.5um), large range 100μm scanner (XY: 100um, Z: 15um)
2.Noise level: Standard scanner less than 0.03nm (RMS)
XY maximum range ±2.5mm, Z-axis stepping motor (50nm/step), range 10mm, drift less than 0.03nm/sec
3.Maximum XY range of ±2.5mm, Z-axis stepping motor (50nm/step) with a range of 10mm, drift less than 0.03nm/sec.
4.Sample stage: Metal sample stage with a diameter of 20 mm, equipped with a sample stage expansion module. The maximum sample size is 35 mm in diameter and 10 mm in height.
5.Scanner control voltage: XY (±200V/18Bit), Z (±200V/26Bit), scan line preview function, maximum four-channel preview, scan rotation ±180° (0.1° step).
6.Data acquisition: Four channels (maximum 2048 x 2048), two channels (maximum 4096 x 4096)."
2.噪音水平：标准型扫描器小于0.03nm (RMS)
3.XY最大范围±2.5mm，Z轴歩进马达(步进 50nm)，范围 10mm，漂移量小于0.03nm/sec
4.样品台：直径20mm的金属样品台，带样品台扩大模块，样品最大尺寸为：直径35mmx10mm (H)
5.扫描器控制电压：XY (±200V/18bit) Z (±200V/26bit)，扫描线预览功能，最大四通道预览，扫描旋转 ±180°(0.1° step)
6.数据采集：4通道(最大2048 x 2048)，2通道(最大4096 x 4096)
1.Scan range: Standard 20μm scanner (XY: 20um, Z: 1.5um), large range 100μm scanner (XY: 100um, Z: 15um)
2.Noise level: Standard scanner less than 0.03nm (RMS)
XY maximum range ±2.5mm, Z-axis stepping motor (50nm/step), range 10mm, drift less than 0.03nm/sec
3.Maximum XY range of ±2.5mm, Z-axis stepping motor (50nm/step) with a range of 10mm, drift less than 0.03nm/sec.
4.Sample stage: Metal sample stage with a diameter of 20 mm, equipped with a sample stage expansion module. The maximum sample size is 35 mm in diameter and 10 mm in height.
5.Scanner control voltage: XY (±200V/18Bit), Z (±200V/26Bit), scan line preview function, maximum four-channel preview, scan rotation ±180° (0.1° step).
6.Data acquisition: Four channels (maximum 2048 x 2048), two channels (maximum 4096 x 4096)."
主要功能及特色
1.电磁性能测试附件：开尔文力显微镜KFM，压电响应显微镜PRM，AC模式的静电力显微镜EFM(AC)，DC模式的静电力显微镜EFM(DC)，磁力显微镜MFM
2.电磁特性测量附件，扫描扩散电阻显微镜SSRM，导电原子力显微镜C-AFM，低电流导电原子力显微镜
3.机械测量附件：粘弹性原子力显微镜VE-AFM，切向调制原子力显微镜LM-FFM，粘着力显微镜
1.Electromagnetic performance testing accessories: Kelvin force microscope (KFM), piezoresponse force microscope (PRM), AC mode electrostatic force microscope EFM(AC), DC mode electrostatic force microscope EFM(DC), magnetic force microscope (MFM).
2.Electromagnetic characteristic measurement accessories: Scanning spreading resistance microscope (SSRM), conductive atomic force microscope (C-AFM), low current conductive atomic force microscope.
3.Mechanical measurement accessories: Viscoelastic atomic force microscope (VE-AFM), lateral modulation friction force microscope (LM-FFM), adhesive force microscope.
2.电磁特性测量附件，扫描扩散电阻显微镜SSRM，导电原子力显微镜C-AFM，低电流导电原子力显微镜
3.机械测量附件：粘弹性原子力显微镜VE-AFM，切向调制原子力显微镜LM-FFM，粘着力显微镜
1.Electromagnetic performance testing accessories: Kelvin force microscope (KFM), piezoresponse force microscope (PRM), AC mode electrostatic force microscope EFM(AC), DC mode electrostatic force microscope EFM(DC), magnetic force microscope (MFM).
2.Electromagnetic characteristic measurement accessories: Scanning spreading resistance microscope (SSRM), conductive atomic force microscope (C-AFM), low current conductive atomic force microscope.
3.Mechanical measurement accessories: Viscoelastic atomic force microscope (VE-AFM), lateral modulation friction force microscope (LM-FFM), adhesive force microscope.
预约资源
检测项目
附件下载
公告
同类仪器
