研究级原子力显微镜
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16/人使用者
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220/次机时次数
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683/小时总时长
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80/次送样次数
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48/人收藏者
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收费标准
机时登录后显示送样详见检测项目 -
设备型号
Dimension Icon -
当前状态
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管理员
侯思润 Dennis Sirun HOU,樊圣垚 Shengyao Fan 020-88338509 13570351473 -
放置地点
W1-124
- 仪器信息
- 预约资源
- 检测项目
- 附件下载
- 公告
- 同类仪器
名称
研究级原子力显微镜
资产编号
MC-SA-0003
型号
Dimension Icon
规格
Dimension Icon
产地
厂家
Bruker
所属品牌
Bruker
出产日期
购买日期
所属单位
材料表征与制备中央实验室 Materials Characterization and Preparation Facility (GZ)
使用性质
科研
所属分类
MCPF-表面分析 Surface Analysis
资产负责人
侯思润 Dennis Sirun HOU
联系电话
020-88338509,13570351473
联系邮箱
sirunhou@hkust-gz.edu.cn
放置地点
W1-124
- 主要规格&技术指标
- 主要功能及特色
主要规格&技术指标
1.扫描范围：X，Y轴扫描范围≥90um × 90um，Z轴扫描范围≥10um
2.X,Y轴闭环噪音≤150pm (1Hz-1kHz)，Z轴闭环噪音≤35pm (1Hz-1kHz)
3.扫描速度：1um范围扫描像素点至少256X256,扫描成像速度不低于40Hz；50um大范围扫描像素点至少256X256,扫描成像速度不低于15Hz
4.样品台：最大可容纳样品直径≥210mm，最大可容纳样品厚度≥50mm
5.马达控制：样品台移动速度≥40mm/s，样品台360度旋转
6.光电检测器：检测带宽≥7MHz，检测系统噪声<10pm，高度检测噪声＜25pm
Scan range: X, Y-axis scan range is ≥90um × 90um, and Z-axis scan range is ≥10um.
Closed-loop noise of X,Y-axis is ≤150pm (1Hz-1kHz), and closed-loop noise of Z-axis is ≤35pm (1Hz-1kHz).
Scan speed: for a 1um scan range, the number of pixels scanned is at least 256X256, with a scanning imaging speed of not less than 40Hz; for a large scan range of 50um, the number of pixels scanned is at least 256X256, with a scanning imaging speed of not less than 15Hz.
Sample stage: The maximum sample diameter that can be accommodated is ≥210mm, and the maximum sample thickness that can be accommodated is ≥50mm.
Motor control: Sample stage movement speed is ≥40mm/s, and it is capable of rotating 360 degrees.
Photoelectric detector: Detection bandwidth ≥7MHz, detection system noise <10pm, height detection noise ＜25pm.
2.X,Y轴闭环噪音≤150pm (1Hz-1kHz)，Z轴闭环噪音≤35pm (1Hz-1kHz)
3.扫描速度：1um范围扫描像素点至少256X256,扫描成像速度不低于40Hz；50um大范围扫描像素点至少256X256,扫描成像速度不低于15Hz
4.样品台：最大可容纳样品直径≥210mm，最大可容纳样品厚度≥50mm
5.马达控制：样品台移动速度≥40mm/s，样品台360度旋转
6.光电检测器：检测带宽≥7MHz，检测系统噪声<10pm，高度检测噪声＜25pm
Scan range: X, Y-axis scan range is ≥90um × 90um, and Z-axis scan range is ≥10um.
Closed-loop noise of X,Y-axis is ≤150pm (1Hz-1kHz), and closed-loop noise of Z-axis is ≤35pm (1Hz-1kHz).
Scan speed: for a 1um scan range, the number of pixels scanned is at least 256X256, with a scanning imaging speed of not less than 40Hz; for a large scan range of 50um, the number of pixels scanned is at least 256X256, with a scanning imaging speed of not less than 15Hz.
Sample stage: The maximum sample diameter that can be accommodated is ≥210mm, and the maximum sample thickness that can be accommodated is ≥50mm.
Motor control: Sample stage movement speed is ≥40mm/s, and it is capable of rotating 360 degrees.
Photoelectric detector: Detection bandwidth ≥7MHz, detection system noise <10pm, height detection noise ＜25pm.
主要功能及特色
1.PeakForce Tapping技术，更便捷获得可靠的高分辨率数据
2.PeakForce QNM峰值力定量纳米力学技术， 在获得高分辨率形貌的同时，还可以得到定量杨氏模量、定量粘附力、定量样品形变量，以及耗散能等多种力学信息
3.PeakForce TUNA峰值力高分辨率电流模块，同步进行形貌、定量纳米力学以及高分辨率电流测试
4.扫描电容显微模块，实现超快的扫描电容显微镜扫描成像，在保证成像的 质量下，在扫描形貌的同时获得电容、deflection等丰富的信号通道
5.具备材料高温加热器和制冷加热样品台
PeakForce Tapping technology enables convenient acquisition of reliable high-resolution data.
PeakForce QNM peak force quantitative nanomechanical technology can provide multiple mechanical information, such as quantitative Young's modulus, quantitative adhesion force, quantitative sample deformation, and dissipation energy simultaneously with high-resolution morphology.
PeakForce TUNA peak force high-resolution current module enables simultaneous tests for high-resolution morphology, quantitative nanomechanics, and high-resolution electrical measurements.
The scanning capacitance microscopy (SCM) module realizes ultrafast scan imaging with rich signal channels including capacitive and deflection signals while ensuring image quality during the topography scan.
Equipped with a high-temperature heater and a cryogenic/heating sample stage.
2.PeakForce QNM峰值力定量纳米力学技术， 在获得高分辨率形貌的同时，还可以得到定量杨氏模量、定量粘附力、定量样品形变量，以及耗散能等多种力学信息
3.PeakForce TUNA峰值力高分辨率电流模块，同步进行形貌、定量纳米力学以及高分辨率电流测试
4.扫描电容显微模块，实现超快的扫描电容显微镜扫描成像，在保证成像的 质量下，在扫描形貌的同时获得电容、deflection等丰富的信号通道
5.具备材料高温加热器和制冷加热样品台
PeakForce Tapping technology enables convenient acquisition of reliable high-resolution data.
PeakForce QNM peak force quantitative nanomechanical technology can provide multiple mechanical information, such as quantitative Young's modulus, quantitative adhesion force, quantitative sample deformation, and dissipation energy simultaneously with high-resolution morphology.
PeakForce TUNA peak force high-resolution current module enables simultaneous tests for high-resolution morphology, quantitative nanomechanics, and high-resolution electrical measurements.
The scanning capacitance microscopy (SCM) module realizes ultrafast scan imaging with rich signal channels including capacitive and deflection signals while ensuring image quality during the topography scan.
Equipped with a high-temperature heater and a cryogenic/heating sample stage.
预约资源
检测项目
附件下载
公告
同类仪器
