小角/广角X射线散射仪 Small/Wide Angle X-Ray Scattering
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16/人使用者
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136/次机时次数
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931/小时总时长
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120/次送样次数
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52/人收藏者
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收费标准
机时登录后显示送样详见检测项目 -
设备型号
Xeuss 3.0 UHR -
当前状态
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管理员
叶倪茹 Niru YE,黄允然 Lawrence Wan Yin Lawrence WONG 020-88338471 -
放置地点
W2-125
- 仪器信息
- 预约资源
- 检测项目
- 附件下载
- 公告
- 同类仪器
名称
小角/广角X射线散射仪 Small/Wide Angle X-Ray Scattering
资产编号
MC-XA-0001
型号
Xeuss 3.0 UHR
规格
Xeuss 3.0 UHR
产地
厂家
赛诺普 Xenocs
所属品牌
赛诺普 Xenocs
出产日期
购买日期
所属单位
材料表征与制备中央实验室 Materials Characterization and Preparation Facility (GZ)
使用性质
科研
所属分类
MCPF-X射线分析 X-Ray Analysis
资产负责人
黄允然 Lawrence Wan Yin Lawrence WONG
联系电话
020-88338471
联系邮箱
lawrwong@hkust-gz.edu.cn
放置地点
W2-125
- 主要规格&技术指标
- 主要功能及特色
主要规格&技术指标
1. Cu 靶高亮度微焦斑点光源 (30W - 50kV / 0.6 mA)
2. Eiger 2R 1M DECTRIS 探测器
3. 检测器台座: 样品到探测器 45-4500mm; q_min ≤ 0.01 nm-1, q_max ≥ 49 nm-1
4. 光斑大小在0.15mm~2.4mm范围内实时、连续、自动改变，精度0.001 mm
5. 样品腔可进行真空、空气/气氛环境测试，入射及反射光路均处于真空
6. 27样品位毛细管样品架, 25样品位固体样品架, 15样品位粉末样品架, 8 个样本的凝胶样品架:
7. 高级全功能掠入射测试组件(GI-W/SAXS)
8. 高温样品台: -150°C 至 350°C
9. 拉伸台: 0-20N, 分辨率=0.001N; 0-200N, 分辨率=0.01N
1. GeniX 3D Cu High flux very long focus (30W generator - 50kV / 0.6 mA)
2. Eiger 2R 1M DECTRIS detector
3. Detector stage: 45-4500mm (sample to detector); q_min ≤ 0.01 nm-1, q_max ≥ 49 nm-1
4. Collimation Size: 0.15mm~2.4mm, resolution=0.001 mm
5. Sample chamber works in both vacuum and atmospheric mode, while keeping incident and reflected beam path in vacuum
6. Interchangeable holders for solution (multicapillary holder, 27 positions) and multiple solids and powders (multi-solid, 15 positions), and gels (rack of 8 cells)
7. Advanced GI-W/SAXS module
8. High temperature sample stage: -150°C to 350°C
9. Modular force stage: 0-20N, resolution=0.001N; 0-200N, resolution=0.01N
2. Eiger 2R 1M DECTRIS 探测器
3. 检测器台座: 样品到探测器 45-4500mm; q_min ≤ 0.01 nm-1, q_max ≥ 49 nm-1
4. 光斑大小在0.15mm~2.4mm范围内实时、连续、自动改变，精度0.001 mm
5. 样品腔可进行真空、空气/气氛环境测试，入射及反射光路均处于真空
6. 27样品位毛细管样品架, 25样品位固体样品架, 15样品位粉末样品架, 8 个样本的凝胶样品架:
7. 高级全功能掠入射测试组件(GI-W/SAXS)
8. 高温样品台: -150°C 至 350°C
9. 拉伸台: 0-20N, 分辨率=0.001N; 0-200N, 分辨率=0.01N
1. GeniX 3D Cu High flux very long focus (30W generator - 50kV / 0.6 mA)
2. Eiger 2R 1M DECTRIS detector
3. Detector stage: 45-4500mm (sample to detector); q_min ≤ 0.01 nm-1, q_max ≥ 49 nm-1
4. Collimation Size: 0.15mm~2.4mm, resolution=0.001 mm
5. Sample chamber works in both vacuum and atmospheric mode, while keeping incident and reflected beam path in vacuum
6. Interchangeable holders for solution (multicapillary holder, 27 positions) and multiple solids and powders (multi-solid, 15 positions), and gels (rack of 8 cells)
7. Advanced GI-W/SAXS module
8. High temperature sample stage: -150°C to 350°C
9. Modular force stage: 0-20N, resolution=0.001N; 0-200N, resolution=0.01N
主要功能及特色
1. 适用于固体（如：粉末，薄膜、块体）、液体（如：胶体、溶液）等各类样品。可以测定散射体分散性、尺寸分布、平均尺寸、体积分数、比表面积、孔隙度、粒子形状、平均壁厚、界面层平均厚度，纳米尺度的周期性结构分析、散射体分形特征，以及材料结晶性、取向及相变分析。
2. 高亮度、高准直X射线，可快速采集、实时观测结果；入射光、散射光处于真空中，有效避免空气散射；获得原子级 500 nm 尺度结构信息；可进行变温、拉伸的原位测试；可实现薄膜样品在超高真空下的GI-W/SAXS测试
1. Able to analyse solids, powders, thin films, gels and liquid/solution samples. To determine their size distribution, volume fraction, surface area, porosity, particle shapes, wall thickness, nanoscale packing arrangements, periodic nature of a nanoparticle, crystallinity, orientation and phase transition analysis
2. Highly focused Cu radiation with strong intensity. "Live view" with updated image during acquisition. Vacuum enclosure of optics to minimize air scattering. Able to characterize the size and structure of nanoparticles as large as 500nm. Able to perform temperature/stress variation experiments, and GI-W/SAXS thin film experiment in vacuum
2. 高亮度、高准直X射线，可快速采集、实时观测结果；入射光、散射光处于真空中，有效避免空气散射；获得原子级 500 nm 尺度结构信息；可进行变温、拉伸的原位测试；可实现薄膜样品在超高真空下的GI-W/SAXS测试
1. Able to analyse solids, powders, thin films, gels and liquid/solution samples. To determine their size distribution, volume fraction, surface area, porosity, particle shapes, wall thickness, nanoscale packing arrangements, periodic nature of a nanoparticle, crystallinity, orientation and phase transition analysis
2. Highly focused Cu radiation with strong intensity. "Live view" with updated image during acquisition. Vacuum enclosure of optics to minimize air scattering. Able to characterize the size and structure of nanoparticles as large as 500nm. Able to perform temperature/stress variation experiments, and GI-W/SAXS thin film experiment in vacuum
预约资源
检测项目
附件下载
公告
同类仪器
